emsec/unsupervised-ic-sem-segmentation - GitHub
This repository contains the implementation, trained models, and an excerpt from our labeled IC scanning electron microscope (SEM) image dataset from our paper "Towards Unsupervised …
SEM Analysis for Integrated Circuits - Rocky Mountain Labs
Jan 17, 2024 · Scanning Electron Microscopy (SEM) is a powerful imaging technique that can be applied to analyze integrated circuits (ICs) at a microscopic level. Here’s how SEM analysis is …
Scanning Electron Microscope Semiconductor Analysis | Thermo …
From simple, general tasks to advanced failure analysis (FA) techniques that need extremely precise voltage-contrast measurements on complex devices, scanning electron microscopy …
Expert Knowledge-based Segmentation Algorithm for IC Layout SEM …
This paper will introduce a novel image processing algorithm based on expert knowledge of SEM (Scanning Electron Microscope) image segmentation of integrated circuit (IC) layouts. Our …
SEM Analysis for Electronics Applications - Rocky Mountain Labs
Dec 13, 2023 · SEM is extensively used in the inspection of integrated circuits (ICs) to assess their quality, identify defects, and ensure proper manufacturing processes. It provides detailed …
IC SEM Reverse Engineering Tutorial using Artificial Intelligence
Feb 18, 2025 · In this tutorial, we will leverage artificial intelligence (AI) techniques to facilitate the reverse engineering of an integrated circuit based on scanning electron microspcopy, …
Towards Unsupervised SEM Image Segmentation for IC Layout …
Nov 26, 2023 · This paper presents a novel approach towards unsupervised SEM image segmentation for IC layout extraction. Existing methods typically rely on supervised machine …
Abstract—In this tutorial, we will leverage artificial intelli-gence (AI) techniques to facilitate the reverse engineering of an integrated circuit based on scanning electron microspcopy, …
Unpaired Synthesis of IC Scanning Electron Microscopy Images …
In this paper, we propose a Structural Constrained Cycle-Consistent Adversarial Network (SC-CycleGAN), that leverages on CycleGAN and novel structural constraints to synthesize IC …
Preparation of a cross-sectional semiconductor IC device sample for SEM …
Dec 31, 2010 · Cross-sectional preparation of the IC device package was successfully achieved through etching with the PECS. Ion beam etching revealed discrete boundaries between the …