X-ray photoelectron spectroscopy (XPS or ESCA) curve fitting procedures, reference materials and useful notes are listed here to provide a starting point for the consistent interpretation of XPS spectra.

Tin develops a thick native oxide due to the reactive nature of clean Tin. The native oxide of Sn O x is 4-6 nm thick. Tin thin films often have a low level of iron (Fe) in the bulk as a contaminant or to strengthen the thin film

Nov 1, 2012 · Here we present an approach to evaluate the XPS spectra of the Ti 2p photoemission line in TiN in a self-consistent manner that accounts for all features observable in an energy window of 80 eV. The evaluation considers the appropriate Tougaard background correction, shake-up features as well as surface and bulk plasmons.

Jan 1, 2005 · Hence, three coprecipitated nanocrystalline indium tin oxide powders of different particle size were investigated by use of X-ray photoelectron spectroscopy. The analysis indicated that indium and tin are in the oxide state; that is, no metallic component could be observed.

Tin electron configuration, X-ray photoelectron spectra, and other elemental information – part of the XPS Reference Table of Elements.

... gain insight into the evolution of the tin oxide during the annealing process, X-ray photoelectron spectroscopy (XPS) was performed to investigate the changes in the Sn-related states...

The respective experimental valence band spectra could be utilized in quantitative analysis of layered tin oxide structures. Valence band spectral shapes are compared to spectra calculated by using a cluster-type (DV-Xα) MO model.

Mar 1, 1990 · XPS analysis associated with argon ion etching was carried out on the underside of float glass to determine the oxidation states of tin. XPS spectra of pure Sn, SnO and SnO 2 specimens were measured at first.

The XPS Spectra section provides raw and processed survey spectra, chemical state spectra, BE values, FWHM values, and overlays of key spectra. Atom% values from surveys are based on sample, as received, and Scofield cross-sections.

electron spectroscopy (XPS) and x-ray emission spectroscopy (XES) are used for samples’ characterization. Effects of oxygen-flow rate, Sn con-tent, and heat-treatment temperature on electronic properties are studied and discussed. XPS measurements show that indium is …