May 1, 2013 · Wafer bin maps (WBMs) that show specific spatial patterns can provide clue to identify process failures in the semiconductor manufacturing. In practice, most companies rely …

Apr 1, 2020 · Wafer bin map (WBM) is outcome of circuit probe (CP) process, which records the spatial distribution of defect dies on the wafer. WBM spatial patterns contain potentially useful …

Substrate mapping (or wafer mapping) is a process in which the performance of semiconductor devices on a substrate is represented by a map showing the performance as a colour-coded grid.

"Similarity Search on Wafer Bin Map through Nonparametric and Hierarchical Clustering." IEEE Transactions on Semiconductor Manufacturing (2021). Kim, Donghwa, and Pilsung Kang.

May 19, 2023 · To address this, we propose a novel rotation- and flip-invariant method based on the labeling rule that the wafer map defect pattern has no effect on the rotation and flip of …

Wafer maps are extremely critical data that need to be carefully analyzed for quality control and yield improvement. A wafer bin map (WBM) presents the chip probing test results for a wafer, …

Defective dies on wafer bin maps (WBMs) usually cluster into specific spatial patterns, which contain critical information for cause identification and yield improvement. This paper proposes …

stdf2map is a lightweight python-based command line application for generating reasonably good looking Bin wafermaps from industry standard STDF data files created by Automated Test …

Semiconductor manufacturers use the wafer bin map recognition (WBMR) system to identify failure modes in processing. This study proposes an WBMR system embedded with three …

A wafer bin map (WBM), which is the result of an electrical die-sorting test, provides information on which bins failed and plays an important role in finding defective wafer patterns in …