Sep 5, 2024 · PHASE CONTRAST MICROSCOPY (PCM) - Phase Contrast Microscopy (PCM) is performed on air filter samples that have been collected to monitor asbestos conditions prior to, during, and after asbestos remediation.

This infographic explains the benefits of SEM against the industry standard technique PCM, and why SEM should be used to provide a true reading.

Perfect Cleave Mechanism (PCM) is a simple manual cleaving tool for cross-section of crystalline materials such as Si, GaN, GaAs, InPh, SiC and others. PCM utilizes SELA’s proprietary Perfect Cleaving technologies to achieve fast cleaving of crystalline materials …

Apr 8, 2024 · This practice requires an SEM with the capability to perform line-scan traces, for example, Y -deflection waveform generation, for the suggested materials. The range of SEM magnification at which this practice is of utility is from 1000 to 50 000 × .

Mar 1, 2013 · SEM and FT-IR techniques and TGA and DSC analysis are used for characterization of material and thermal properties. The composite PCM contained 48.3 wt.% of paraffin without leakage of melted PCM and therefore this composite found to be a form-stable composite PCM. SEM results indicate that the paraffin bounded into the pores of GO.

Image of pollen grains taken on a SEM shows the characteristic depth of field of SEM micrographs. A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons.

Sep 19, 2018 · Scanning electron microscopy (SEM) is an important electron microscopy technique that is capable of achieving a detailed visual image of a particle with high-quality and spatial resolution. SEM is a multipurpose state-of-the-art instrument which is largely employed...

Dec 13, 2023 · SEM enables detailed inspection of printed circuit boards (PCBs) to ensure proper soldering, component placement, and overall structural integrity. This is vital for manufacturing high-quality electronic assemblies.

Compared to Light Microscopy (LM), the Transmission Electron Microscopy (TEM) is built at the opposite. The source of illumination is at the top of the microscope and the screen at the bottom.

SELA offers sample preparation services for Physical Failure Analysis utilizing award winning state of the art technologies. For additional information about SELA products please, contact us.