The Talos L120C TEM is an ideal solution for entry level cryo-studies, simple point and click imaging, and a highly efficient instrument for tomography and single particle analysis sample …

Accelerate and Advance for Materials Science SDB and Auto TEM: A comprehensive solution for lamella preparation

Thermo Fisher provides the broadest portfolio of semiconductor metrology, characterization and fault analysis instruments to accelerate pathfinding and development, maximize yields, and …

A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission …

The Helios 6 HD FIB-SEM delivers high-volume, high-quality, repeatable TEM samples on a wide variety of semiconductor device types and in a variety of manual and semi-automated …

Thermo Fisher offers its SEM, SDB, and TEM products for the characterization of catalyst nanoparticles. But if the nanoparticles are in such a small size as below 10nm, we recommend …

This concise two-page flyer features general information on transmission (TEM) and scanning (SEM) electron microscopes as well as anaglyph 3D images recorded with SEM. See the …

In this study, the researchers explore three basic SDB algorithms which are often used, namely the Lyzenga algorithm, the Stumpf algorithm, and the Van Hengel & Spitzer (VHS) algorithm.

The Scanning Transmission Electron Microscope (STEM) rasters a focused incident probe across a specimen that (as with the TEM) has been thinned to facilitate detection of electrons …

与之相比， 聚焦离子束 （focused ion beam，FIB）作为一种超精细样品制备技术，可对金属、合金、陶瓷、矿物、玻璃和有机材料等进行加工，制得宽10~20 μm宽、10~15 μm高、100~150 …