Aug 1, 2000 · PZT (65/35) films were prepared using a diol route with 10 mol% excess Pb and deposited on Pt/Ti/SiO 2 /Si substrates. Samples were characterised using XRD and cross-sectional TEM/STEM in combination with EDX and EELS.

In this paper we report a detailed structural and optical characterization of PZT nanorods fabricated by templating into porous alumina membranes (of 200 nm pore diameter).

Dec 15, 2017 · The microstructural characteristics of lead zirconate titanate (PZT) ceramic at high temperature were examined by in situ transmission electron microscopy (TEM) observations of lattice and microstructural formations.

Oct 25, 2024 · Transmission electron microscopy (TEM) analyses unveiled that TZO possesses a single-crystal structure with the axial direction along the [010] crystallographic orientation, while PZT exhibits a polycrystalline structure with a discernible degree of misorientation.

Mar 2, 2023 · Nanostructures of the PZT films were investigated via scanning electron microscopy (SEM, Sigma 300, Zeiss, Oberkochen, Germany) and transmission electron microscopy (TEM, JEM-2010, JEOL, Tokyo, Japan), respectively.

Jul 7, 2008 · Crack-free single-layer PZT films of up to 200 nm thick were prepared by triol-based sol–gel processing onto Pt/Ti/SiO 2 /Si substrates. Films ∼75 nm thick exhibited a microstructure free of pores and second phase.

Jun 6, 2011 · The SEM and TEM images show that the self-separated hydrothermal PZT films possess a large columnar grain structure with good connectivity. The columnar grain structure and nanopores could help relieve the residual stress in the films and result in …

Jul 1, 1990 · Ferroelectric PZT thin films were prepared by sol-gel methods and RF magnetron sputteomg. Sputtered PZT fast fired at 650°C for 30 minutes showed microporosity. For the sol-gel route, solution precursors had a significant effect on …

This work analyses thin films of compositions within the rhombohedral phase of the lead zirconate titanate (PZT) system, and compares the results with previous reports on the structure and physical properties carried out on the same materials, but in the ceramic form.

Aug 1, 2000 · PZT (65/35) films were prepared using a diol route with 10 mol% excess Pb and deposited on Pt/Ti/SiO2/Si substrates. Samples were characterised using XRD and cross-sectional TEM/STEM in...