JEOL can offer a wide range of lineups from general purpose scanning electron microscopes(W-SEM) including a benchtop type that allows operations just to anyone without specific knowledge and techniques, to high-end models of field emission scanning electron microscopes (FE-SEM).

From our most powerful flagship Field Emission SEM with the ultimate resolution, magnification, and analytical flexibility, to our easy-to-use entry level Benchtop SEM, JEOL offers a wide choice of SEMs to suit all applications.

The new high-sensitivity 4-segmented backscattered electron detector enables 2-pane viewing of a SEM image and a 3D image using Live 3D function. In addition to instantaneous shape determination for samples with complex topographies, depth information can also be acquired.

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The JSM-IT710HR Field Emission SEM is a compact, versatile Schottky Field Emission SEM that delivers the next level of intelligent technology for high spatial resolution imaging and analysis. Our unique in-lens field emission gun and advanced electron optics deliver large probe currents while maintaining a small probe making this microscope ...

The JSM-210 is the most compact stationary scanning electron microscope of JEOL. The newly developed stage is motor-driven for all five axes of movement, making it safer and faster to use. In addition, the newly equipped "Simple SEM" automatically acquires observation and analysis by simply selecting the field of view.

Scanning Electron Microscopes (SEM): When resolutions in the nm to sub-nm range are required and the handling of the device thus takes on an important role, JEOL scanning electron microscopes are the first choice.

The Scanning Electron Microscope (hereinafter “SEM”) enables a clear observation of very small surface structures, which is not possible with an optical microscope (hereinafter “OM”).

Increase your scope with the JCM-7000 benchtop SEM. The perfect complement to light microscopy, this compact, tabletop SEM with a magnification range of 10X – 100,000X gives you the power of scanning electron microscopy in a convenient package.

The JSM-IT210 InTouchScope™ SEM Series incorporates the latest in JEOL intelligent technology and automation in a compact package. Smart – Flexible – Powerful Smart – The latest innovations with our InTouchScope™ series SEMs make them accessible at every level.