High-resolution transmission electron microscopy is an imaging mode of specialized transmission electron microscopes that allows for direct imaging of the atomic structure of samples. [1][2] It is a powerful tool to study properties of materials on the atomic scale, such as semiconductors, metals, nanoparticles and sp 2 -bonded carbon (e.g., gra...

This chapter focuses on two methods for correlative 3D imaging, combining confocal laser scanning microscopy (CLSM) with focused ion beam-scanning electron microscopy (FIB-SEM), or wide-field light microscopy (LM) and SEM using serial sections of embedded samples.

samples and changes in the phase of the electron waves. When 2 or more electrons beams scattered from the sample interfere and are transferred at high magnification to detector plane, there can form an interference patte.

3) Samples for HR-SEM measurements should be completely dry, vacuum &e-beam compatible. Magnetic samples can be analyzed by HRSEM, but only in opti-mode. Magnetic samples should be loaded separately, but not to be mixed with non-magnetic samples.

The diameter, morphology and density of synthetic fibers are key parameters that determine the lifetime and functionality of a filter. Scanning electron microscopy (SEM) is the ideal technique for quickly and easily investigating these features. Learn more ›

High-resolution (HR) SEM. By high-resolution (HR) SEM, we denote imaging of the sample with high accuracy, in order to faithfully represent the surface morphology. Instrumentally, there are two typical requirements.

Jan 13, 2012 · Probing atoms: An overview of high-resolution scanning transmission electron microscopy (HRSTEM) techniques is given (see picture). Current advances suggest that HRSTEM-related techniques are fundamental tools for comprehensive assessment of properties at the atomic scale.

The low-voltage scanning electron microscope (SEM) is widely used in many industrial and research applications due to its ability to image surface details with high resolution and fidelity.

High-resolution transmission electron microscopy is the most powerful technique for direct imaging of atoms in nanoparticles. A conventional TEM usually has an image resolution of better than 0.2 nm and is very capable of resolving atomic scale structures of nanoparticles.

Scanning Electron Microscope is a versatile analytical microscope with a large specimen chamber and can handle large specimens at the analytical working distance of 8.5mm owing to a combination of the inclined detectors and the sharp conical objective lens.