Acoustic microscopy techniques analyze the intensity and phase of both the reflected and transmitted waves to create visual images reflecting the variations in the acoustic impedance …

SAM uses ultrasound waves to detect changes in acoustic impedances in integrated circuits (ICs) and other similar materials. Pulses of different frequencies are used to penetrate various …

Mar 13, 2019 · Scanning acoustic microscopy (SAM) also denominated acoustic micro imaging (AMI) and scanning acoustic tomography (SAT) is a consolidated and recognized tool for …

SAM (also known as ultrasonic microscopy and C-SAM, or confocal scanning acoustic microscopy) is a common failure analysis method in materials science. It is used for quality …

The C-SAM®, or C-Mode Scanning Acoustic Microscope, is a very high frequency pulse-echo ultrasonic microscope that generates images by mechanically scanning a transducer over a …

Scanning Acoustic Microscopy (C-SAM) has revealed as the most effective and complete non-destructive approach for the detection of critical and latent anomalies within COTS and plastic …

In this regards Scanning Acoustic Microscopy (SAM) is one of preferred methods for the non-destructive inspection of microelectronic assemblies and components. Flip Chip systems …

Integrated components (ICs), microchips, bonded wafers, metals, ceramics, composites, and many other materials and systems can be inspected for quality of bonding/delamination, …

Scanning Acoustic Microscopy (CSAM) is a non-invasive technique used to non-destructively inspect for construction details, defects or the integrity of an optically opaque solid sample, …

Confocal Scanning Acoustic Microscopy (C-SAM) is a non-destructive and non-invasive method to quickly provide high precision acoustic imaging on discrete planes of a packaged part. Sage …