
Argon, or another noble gas, is admitted to the ionization region where a proportion of the gas atoms is ionized by the electrons. An electrode at the exit from the ionization region and co-axial with it is held at a negative potential with respect to the grid.
IG2 Sputter Ion Source Package - RBD Instruments
The 04-165 Backfill Ion Source generates an energetic inert gas ion beam for sputter-etching solid surfaces. The source requires a static pressure of 5x10-5 torr with an inert gas such as argon (see datasheet for list of compatible gasses).
Ion gun - Wikipedia
An Ion Gun typically refers to an instrument that generates a beam of heavy ions with a well defined energy distribution. The ion beam is produced from a plasma that has been confined within a volume. Ions of a particular energy are extracted, accelerated, collimated and/or focused.
Ion source IS 40F1 - PREVAC
The ion source IS 40F1 is a compact, easy-to-use extractor-type ion gun with a beam-focusing feature, mainly used for sample surface cleaning.
IQE 11/35 | SPECS - SPECSGROUP
The IQE 11/35 generates an ion current of 10 -15 µA (Argon) with a Gaussian beam profile. The beam diameter and current density depend on the source-to-sample distance, which can be optimized by choosing one of the standard insertion length (62.5 mm, 120 mm, 190 mm, 250 mm) or a customized length.
Introducing the Gas Cluster Ion Beam Ion Gun - PHI
Nov 9, 2010 · In October, at the 57th AVS Exhibition in Albuquerque, New Mexico, Physical Electronics introduced an Argon Gas Cluster Ion Beam (GCIB) source as our newest tool for surface analysis. The GCIB source provides Ar 2,500 + cluster ions which can be used to depth profile polymeric materials on both XPS and TOF-SIMS instruments.
Within the electron gun, the electrons are accelerated by a small amount to ensure efficient ionization of the noble gas (usually argon). This gas is injected directly into the gun and a sufficiently high flux density of ions is generated at a low chamber pressure.
The IG20 ion gun is differentially pumped and includes full raster scanning, incorporation of a neutrals dump, DN-35-CF(2.75 inch diameter) Conflat-type mounting flange and simple replacement of the ion source yttria-coated iridium twin-filament.
A low energy argon ion gun for cleaning samples in an electron ...
Oct 1, 1973 · An ion gun is described which operates in a relatively high pressure of argon ( approximately 0.1 Torr). In operation, the voltage across the discharge region of the gun is 500 V, but subsequent ion-atom collisions in the spectrometer sample chamber reduce the ion-atom energy to about 0.1-1.0 eV at the sample surface.
AG40 ion gun-华萃仪器 - csi-lab.cn
The IQE 11/35 generates an ion current of 10-15 µA (Argon) with a Gaussian beam profile. The beam diameter and current density depend on the source-to-sample distance, which can be optimized by choosing one of the standard insertion length (62.5 mm, 120 mm, 190 mm, 250 mm) or a customized length.
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