Abstract: High temperature reverse bias (HTRB) testing is widely used to assess the reliability of commercial SiC MOSFETs. This study investigates 1700V planar SiC MOSFETs before and after packaging ...
Department of Nuclear Medicine, Tongji Hospital, Tongji Medical College and State Key Laboratory for Diagnosis and Treatment of Severe Zoonotic Infectious Diseases, Huazhong University of Science and ...
Department of Chemistry, Hong Kong University of Science & Technology, Hong Kong 999077, China Division of Environment and Sustainability, Hong Kong University of Science & Technology, Hong Kong ...
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