However, the AI-driven demand for better performing and larger capacity DRAM is propelling R&D into beyond 10-nm generations. This requires innovations in capacitors, access transistors, and bit cell ...

Identifying bad memory chips can quickly become a chore, so [Jan Beta] spent some time putting together a cheap DRAM tester out of spare parts. This little tester can be used with 4164 and 41256 ...

ETNA 3D chip stack paving the way for DRAM on logic integration ... IMEC's research bridges the gap between the fundamental research at universities and R&D in the industry. It has unique processing ...