The idea is you bolt the wafer probe card into the top of the machine, needles-down, then wheel the whole thing over to the ATE. The ATE head will have that pogo-tower already docked. Next you ...
Wafer testing is conducted using Automatic Test Equipment (ATE) along with test infrastructures such as the Prober Interface Board (PIB), signal tower, and probe card. In this paper, we present the ...
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