Among the various types of electron microscopy, scanning electron microscopy (SEM) and transmission electron microscopy (TEM) are the most common. While both techniques harness the power of electrons ...

New system, same great performance: Remove hydrocarbons on TEM and SEM samples that may impact analysis. Minimize surface damage and maintain the integrity of silicon Play Minimize surface damage ...

SEM and TEM cross-section samples can be produced using the PELCO ® Tripod Polisher™ 590. To create a TEM sample the original sample is attached to the face of a unique SEM stud, which is then ...