To ensure a shorter and right Time-to-Market, it becomes increasingly necessary to debug timing mismatches for Scan patterns faster, if they exist. For larger designs, it becomes more difficult to ...

Scan chain 4. NEED FOR A SCAN CHAIN IN THE DESIGN Scan chains are used to detect manufacturing defects present in the combinational logic of the design. ATPG tool generates the test patterns in such a ...

The brain scan data collected during the image viewing task was then analyzed to examine both the overall level of brain activity and the patterns of activity in different brain regions known to ...

After collecting the brain scan data, the researchers used sophisticated ... clinically diagnosed anxiety disorders to see if ...