At RAPID + TCT 2025, we had the opportunity to talk to Jonathan Buckley from JEOL as he gave insights into the current state ...

The JEOL 1400 High Contrast Transmission Electron Microscope is a state-of-the-art imaging system designed for high-resolution transmission electron microscopy (TEM). This microscope features advanced ...

The JEOL JSM-IT100 is capable of 33-300,000X magnification with 4nm resolution. It is equipped with a secondary electron detector, backscatter electron detector, low vacuum secondary detector and ...

The JEOL 2100 STEM has energy-dispersive x-ray microanalysis (Bruker), electron energy loss spectroscopy (Gatan EELS) and energy selective imaging (ESI Gatan GIF). All electron microscopes are covered ...

Scanning Electron Microscope (SEM) and Electron Probe Microanalyzer ... Our new NSF-funded field-emission EPMA (JEOL JXA iHP200F) was the first to be installed in the U.S. and is equipped with 5 WDS ...

The JEOL JSM IT500 scanning electron microscope (SEM) is used for high-resolution imaging and qualitative X-ray microanalysis of conductive and non-conductive samples at a magnification range between ...

grant by NSF in Summer 2014 to purchase a new electron microprobe, a JEOL JXA-8230 equipped with LaB6 electron gun (PIs K.H. Mahan, J.M. Allaz, and G.L. Farmer). This new instrument will replace the ...

The University of Oxford’s Department of Materials has entered a new era in microscopy with the arrival of a custom-built £3 ...

The electron microscopes in the main suite are all fitted with digital image capture and energy dispersive X-ray systems for analysis of elemental composition and distribution. The most recent ...

The instrument is a dedicated field emission, wavelength dispersive electron microprobe (EPMA). Quantitative elemental data can be obtained from most elements (Fluorine to Uranium) with detection ...