It is essential to maintain high productivity and quality throughout the design flow. This keeps projects on schedule, within budget, and ensures they remain high-quality, reliable, yield well and ...

Miteshwar M. Patel (ASIC Engineer, eInfochips Ltd) Nirav Nanavati (Tech Lead, eInfochips Ltd) Abstract Design for testability (DFT) and low power issues are very much related with each other. In this ...

The simple and regular array structure also reduces circuit complexity and therefore reduces design costs. Both Xilinx [1] and Altera [2] provide users of their FPGAs options to support the LTE ...

More Than 50 Tapeouts Prove DFT MAX Reduces Test Time and Cost MOUNTAIN VIEW, Calif., July 20 /PRNewswire-FirstCall/ -- Synopsys, Inc. (NASDAQ:SNPS), a world leader ...